journal article·1994-04

48938 In process characterization of gallium arsenide crystals by X-ray digital radiography and computed tomography

J.W. Eberhard, K.W. Mitchell, R.A. Koegl, J.M. Brown

NDT & E International· Volume 27· Issue 2
Publisher page

Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

Source: Not provided · Quality: missing

Research context

OpenAlex topics: Advanced Semiconductor Detectors and Materials

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References

Reference metadata was not supplied for this record.