A comparison of film based tomography and computed tomography for advanced ceramic materials 38817 Ellingson, W.A.; Vannier, M.W.; Kriz, R.J. Argonne National Laboratory, Illinois (United States), CONF-8704231-1, DE88-003114, 21 pp. (Jun. 1987)
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OpenAlex topics: Advanced X-ray and CT Imaging
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