The application of digital image processing technique in industry production non-destructive testing Senyuan, Zhu; Chenggui, Yi; Peng, Yang; Zongfa, Zhang; Lin, Li; Jianhuan, Li; Xuhui, Wang Proceedings of the 12th World Conference on Non-Destructive Testing, Amsterdam (Netherlands), 23–28 Apr. 1989, Vol. 2, pp. 1308–1311. Edited by J. Boogaard and G.M. van Dijk, Elsevier, 1989
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OpenAlex topics: Integrated Circuits and Semiconductor Failure Analysis · Optical measurement and interference techniques · Industrial Vision Systems and Defect Detection
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