Novel non-destructive X-ray technique for near-real time defect mapping Anathanarayanan, T.S.; Rosemeier, R.G.; Mayo, W.E.; Sacks, S. Nondestructive Characterisation of Materials 2, Montreal (Canada), 21–23 Jul, 1986. pp. 657–666. Edited by J.F. Bussiere, J.P. Monchalin, C.O. Ruud, R.E. Green Jr. Plenum Press, 1987
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Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Non-Destructive Testing Techniques · Advanced X-ray and CT Imaging
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