journal article·1990-06

Scanning acoustic microscopy in materials characterization Vetters, H.R.; Mayr, P.; Boseck, S.; Luebben, Th.; Matthaie, R.; Schulz, A. Scanning Electron Microscopy, Part 3, pp. 981–989 (1985)

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NDT & E International· Volume 23· Issue 3
Publisher page

Abstract

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Research context

OpenAlex topics: Ultrasonics and Acoustic Wave Propagation · Smart Materials for Construction · Anodic Oxide Films and Nanostructures

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