Automatic radiographic film evaluation by Kontron SEM-IPS Arun Junai, A.; Hofstede, A.; Koster, H.; van Wolferen, H. Proceedings of the 12th World Conference on Non-Destructive Testing, Amsterdam (Netherlands) 23–28 Apr. 1989, Vol. 1, pp. 120–121. Edited by J. Boogaard and G.M. van Dijk, Elsevier, 1989
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OpenAlex topics: Advanced X-ray and CT Imaging · Medical Imaging Techniques and Applications · Radiomics and Machine Learning in Medical Imaging
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