X-ray tomography and nuclear magnetic resonance imaging applications for advanced ceramic materials 37715 Ellingson, W.A.; Sawicka, B.D.; Kriz, R.J.; Gronemeyer, S.; Ackerman, J.L. Argonne National Laboratory, Argonne, Illinois (United States), CONF-870422-8, DE87-011534, 33 pp. (Feb. 1987)
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OpenAlex topics: X-ray Diffraction in Crystallography
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