A comparison of analog tomography and computed tomography for nondestructive evaluation of advanced ceramic materials 39603 Ellingson, W.A.; Vannier, M.W.; Kriz, R.J. Proceedings of the 16th Symposium on Nondestructive Evaluation, San Antonio, Texas (United States), 21–23 Apr. 1987. pp. 252–263. Nondestructive Testing Information Analysis Center, Texas, USA
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OpenAlex topics: Non-Destructive Testing Techniques · Advanced X-ray and CT Imaging · Electrical and Bioimpedance Tomography
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