journal article·2026-05-12

Detecting linear dichroism with atomic resolution

Roger Guzman, Ján Rusz, Ang Li, Juan Carlos Idrobo, Wu Zhou, Jaume Gazquez

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Abstract

X-ray linear dichroism has been pivotal for probing electronic anisotropies, but its inherent limited spatial resolution precludes the atomic-scale investigations of orbital polarization. Here we introduce a versatile electron linear dichroism methodology in scanning transmission electron microscopy that overcomes these constraints. Using electron energy loss spectroscopy with an atomic-sized probe and selecting momentum transfers along two orthogonal directions, we directly visualize orbital occupation at individual atomic columns in real space. Using strained La0.7Sr0.3MnO3 thin films as a model system, we resolve the Mn3d eg orbital polarization with sub-ångström precision. We show that compressive strain stabilizes 3z2-r2 occupation whereas tensile strain favours x2-y2. These results validate our approach against established X-ray measurements, achieving the ultimate single-atomic-column sensitivity. We further demonstrate two optimized signal extraction protocols that adapt to experimental constraints without compromising sensitivity. This generalizable platform opens unique opportunities to study symmetry-breaking phenomena at individual defects, interfaces and in quantum materials where atomic-scale electronic anisotropy governs emergent functionality.
Source: europepmc · Quality: candidate unverified · Source record ↗

Research context

OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Chemical and Physical Properties of Materials · Electronic and Structural Properties of Oxides

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

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