Magic under the microscope
Source abstract
Abstract
Four-dimensional scanning transmission electron microscopy is demonstrated to be a powerful technique for interrogating local strain of twisted graphene bilayers, revealing a two-regime lattice reconstruction process below the ‘magic’ angle.
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Source: openaire · Quality: needs review · Source record ↗
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Research context
OpenAlex topics: Graphene research and applications · Nanowire Synthesis and Applications · 2D Materials and Applications
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References (10)
Show source-provided references
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