A coherent look at stress
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Abstract
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Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Surface and Thin Film Phenomena · Force Microscopy Techniques and Applications
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References (7)
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5. Watari, M. et al. Nature Mater. 10, 862–866 (2011).10.1038/nmat3124 ↗
6. Feidenhans'l, R. Surf. Sci. Rep. 10, 105–188 (1989).10.1016/0167-5729(89)90002-2 ↗
7. Pfeifer, M. A., Williams, G. J., Vartanyants, I. A., Harder, R. & Robinson, I. K. Nature 442, 63–66 (2006).10.1038/nature04867 ↗