Exploring interlayer space
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Abstract
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Research context
OpenAlex topics: Advancements in Semiconductor Devices and Circuit Design · Advanced Electron Microscopy Techniques and Applications · Electronic and Structural Properties of Oxides
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References (4)
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1. Wu, Y., Li, D., Wu, C.-L., Hwang, H. Y. & Cui, Y. Nat. Rev. Mater. 8, 41–53 (2023).10.1038/s41578-022-00473-6 ↗
2. Al Balushi, Z. Y. et al. Nat. Mater. 15, 1166–1171 (2016).10.1038/nmat4742 ↗
3. Briggs, N. et al. Nat. Mater. 19, 637–643 (2020).10.1038/s41563-020-0631-x ↗
4. Yuk, J. M. et al. Science 336, 61–64 (2012).10.1126/science.1217654 ↗