Better vision with electron lenses
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Abstract
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Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Force Microscopy Techniques and Applications
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References (8)
Show source-provided references
1. Batson, P.E., Dellby, N. & Krivanek, O.L. Nature 418, 617–620 (2002).10.1038/nature00972 ↗
2. Crewe, A.V., Isaacson, M. & Johnson, D. Rev. Sci. Inst. 40, 241–246 (1969).10.1063/1.1683910 ↗
3. Scherzer, O. J. Appl. Phys. 20, 20–29 (1949); Z. Phys. 101, 593 (1936).10.1063/1.1698233 ↗
4. Rose, H. Optik 33, 1 (1971); Optik 85, 19 (1990).
5. Haider, M., Uhlemann, S., Schwan, E., Kabius, B. & Urban, K. Nature 392, 768–769 (1998).10.1038/33823 ↗
6. Meyer, R.R. et al. Science 289, 1324–1326 (2000).10.1126/science.289.5483.1324 ↗
7. Gabor, D. Nature 161, 777–778 (1948).10.1038/161777a0 ↗
8. Lodge, O. Atoms and Rays 74 (Ernest Benn, London, 1924).