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Bibliographic record
Abstract
No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.
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Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Advanced Materials Characterization Techniques
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (5)
Show source-provided references
1. Zhu, Y., Inada, H., Nakamura, K. & Wall, J. Nature Mater. 8, 808–812 (2009).10.1038/nmat2532 ↗
2. Salow, H. Phys. Z. 41, 434–436 (1940).
3. Bethe, H. Phys. Rev. 59, 940–941 (1941).
4. Pennycook, S. J. & Howie, A. Phil. Mag. Lett. 41, 809–827 (1980).10.1080/01418618008243890 ↗
5. Spencer, J. P., Humphreys, C. J. & Hirsch, P. B. Phil. Mag. Lett. 26, 193–213 (1972).10.1080/14786437208221029 ↗