journal article·2025-03

Interlayer reconstruction phase transition in van der Waals materials

Junwei Zhang, Laiyuan Wang, Jingtao Lü, Zhe Wang, Huan Wu, Guilin Zhu, Nan Wang, Fei Xue, Xue Zeng, Liu Zhu, Yang Hu, Xia Deng, Chaoshuai Guan, Chen Yang, Zhaoyang Lin, Peiqi Wang, Boxuan Zhou, Jing Lü, Wenguang Zhu, Xixiang Zhang, Yu Huang, Wei Huang, Yong Peng, Xiangfeng Duan

Nature Materials· Volume 24· Issue 3
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Abstract

Van der Waals materials display rich structural polymorphs with distinct physical properties. An atomistic understanding of the phase-transition dynamics, propagation pathway and associated evolution of physical properties is essential for capturing their potential in practical technologies. However, direct visualization of the rapid phase-transition process is fundamentally challenging due to the inherent trade-offs among atomic resolution, field of view and imaging frame rate. Here we exploit a controllable current-driven phase transition and utilize in situ scanning transmission electron microscopy to visualize dynamic atomic rearrangements during the 2H-α to 2H-β transition in layered In2Se3. We identify a unique intralayer-splitting (unzipping) and interlayer-reconstruction (zipping) pathway, driven by an energy-cascading mechanism through which bond formation across the van der Waals gap facilitates bond cleavage in the covalent layers. We also observe current-direction-dependent asymmetric phase-transition propagation and attribute it to a temperature profile induced by the Peltier effect at the heterophase interface. These findings provide insights that are essential for designing tailored structural phase transitions in advanced technologies.
Source: europepmc · Quality: candidate unverified · Source record ↗

Research context

OpenAlex topics: 2D Materials and Applications · Graphene research and applications · Semiconductor materials and interfaces

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