journal article·2025-08Open access

Correlative transmission electron and soft x-ray microscopy for bridging length scales and functional properties in nanoscience and materials research

Armin Kleibert, C.A.F. Vaz, Rolf Erni

Nano Today· Volume 63

Abstract

Transmission electron and soft x-ray microscopy have contributed significantly to our understanding of phenomena in fields ranging from biology to materials science by providing highly complementary information from the atomic level to the nano- and micrometre scale, including from structural, electronic, magnetic, and chemical perspectives. However, correlative transmission electron and soft x-ray microscopy investigations on the very same samples that take full advantage of their complementary imaging and spectroscopic capabilities are surprisingly rare. In this review, we focus on the most recent developments in combining the various types of transmission electron and soft x-ray microscopy techniques including progress in sample environment, in situ and operando techniques. Based on recent research examples ranging from nanocatalysis to functional materials and 2D materials, we highlight the unique opportunities promised by fully correlative transmission electron and soft x-ray microscopy approaches. • Correlative transmission electron and soft x-ray microscopy yield highly complementary information from atomic to mesoscale. • We discuss the fundamental, practical aspects, and recent developments in electron and soft x-ray correlative microscopy. • We highlight insights from correlated microscopy in fields from nanocatalysis to functional materials and 2D materials.
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Research context

OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Magnetic properties of thin films · Advanced X-ray Imaging Techniques

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

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