journal article·2024-02-12Open access

Contact resonance atomic force microscopy using long elastic tips

Nadav Zimron-Politi, Ryan C Tung

Nanotechnology· Volume 35· Issue 7

Abstract

Abstract In this work, a new theoretical model for contact resonance atomic force microscopy, which incorporates the elastic dynamics of a long sensing tip is presented. The model is based on the Euler–Bernoulli beam theory and includes coupling effects from the two-beam structure, also known as an ‘L-shaped’ beam in the literature. Here, high-accuracy prediction of the sample stiffness, using several vibration modes with a relative error smaller than 10% for practical working ranges, is demonstrated. A discussion on the model’s capability to predict the dynamic phenomena of eigenmode veering and crossing, as the force applied to the sample increases, is presented. The L-shaped beam model presented here is also applicable for structural applications such as: micro-electro-mechanical systems, energy harvesting, and unmanned aerial vehicle landing gear.
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Research context

OpenAlex topics: Force Microscopy Techniques and Applications · Mechanical and Optical Resonators · Near-Field Optical Microscopy

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

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