Foreword
Source abstract
Abstract
Abstract In nanotechnology the most important aim is to obtain dimensional accuracy of processed products of the order of a few nanometres. The processing accuracy is limited by machining or processing errors, which can be divided into two categories: deviational (or systematic) errors and scattering (random) errors, as shown in Fig. 0.1.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Advanced Surface Polishing Techniques · Advanced machining processes and optimization · Surface Roughness and Optical Measurements
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References
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