Corrigendum: Identifying single electron charge sensor events using wavelet edge detection (2015 Nanotechnology 26 215201)
Source abstract
Abstract
Abstract The simulated noise used to benchmark wavelet edge detection in this work was described incorrectly. The correct description is given here, and new results based on noise that matches the original description are provided. The results support our original conclusion, which is that wavelet edge detection outperforms thresholding in the presence of white noise and 1/ f noise.
Source: crossref · Quality: baseline
Research context
OpenAlex topics: Analytical Chemistry and Sensors
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References
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