other·2004-02-17

Characterization of Nanostructures

Michael Köhler, Wolfgang Fritzsche

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Abstract

This chapter contains sections titled: Geometrical Characterization Layer Thickness and Vertical Structure Dimensions Lateral Dimensions Structures that Assist Measurement Characterization of Composition of Layers and Surfaces Atomic Composition Characterization of the Chemical Surface Functional Characterization of Nanostructures
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Research context

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Materials Characterization Techniques

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