article·2000-02-22

Atomic force microscope for direct comparison measurement of step height and crystalline lattice spacing

Tôru Fujii, Katsuhiko Imabori, Hideki Kawakatsu, Satoshi Watanabe, Hannes Bleuler

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Abstract

Figure 3(a ) of this paper was repeated in error. The correct figure 3, parts (a ) and (b ), is shown below.
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Force Microscopy Techniques and Applications · Mechanical and Optical Resonators · Near-Field Optical Microscopy

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