journal article·2009-07-01

Controlling electron transfer processes on insulating surfaces with the non-contact atomic force microscope

Thomas Trevethan, Alexander Shluger

Nanotechnology· Volume 20· Issue 26
Publisher page

Abstract

We present the results of theoretical modelling that predicts how a process of transfer of single electrons between two defects on an insulating surface can be induced using a scanning force microscope tip. A model but realistic system is employed which consists of a neutral oxygen vacancy and a noble metal (Pt or Pd) adatom on the MgO(001) surface. We show that the ionization potential of the vacancy and the electron affinity of the metal adatom can be significantly modified by the electric field produced by an ionic tip apex at close approach to the surface. The relative energies of the two states are also a function of the separation of the two defects. Therefore the transfer of an electron from the vacancy to the metal adatom can be induced either by the field effect of the tip or by manipulating the position of the metal adatom on the surface.
Source: openalex_inverted_index · Quality: baseline

Research context

OpenAlex topics: Force Microscopy Techniques and Applications · Electronic and Structural Properties of Oxides · Surface and Thin Film Phenomena

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (29)

Show source-provided references
1. 10.1038/344524a010.1038/344524a0 ↗
2. 10.1126/science.107676810.1126/science.1076768 ↗
3. 10.1103/RevModPhys.75.94910.1103/RevModPhys.75.949 ↗
4. 10.1103/RevModPhys.75.128710.1103/RevModPhys.75.1287 ↗
5. Oyabu N · Nanotechnology · 2005 · 16 · S11210.1088/0957-4484/16/3/021 ↗
6. 10.1038/nmat129710.1038/nmat1297 ↗
7. Hirth S · Nanotechnology · 2006 · 17 · S14810.1088/0957-4484/17/7/S08 ↗
8. 10.1103/PhysRevB.63.18411110.1103/PhysRevB.63.184111 ↗
9. Trevethan T · Nanotechnology · 2006 · 17 · 586610.1088/0957-4484/17/23/026 ↗
10. 10.1016/S1293-2558(00)00113-810.1016/S1293-2558(00)00113-8 ↗
11. 10.1016/j.susc.2006.01.03410.1016/j.susc.2006.01.034 ↗
12. 10.1007/s00339-003-2437-510.1007/s00339-003-2437-5 ↗
13. 10.1103/PhysRevB.76.08541410.1103/PhysRevB.76.085414 ↗
14. 10.1073/pnas.96.6.260210.1073/pnas.96.6.2602 ↗
15. 10.1063/1.46491310.1063/1.464913 ↗
16. 10.1103/PhysRevB.37.78510.1103/PhysRevB.37.785 ↗
17. 10.1016/S0039-6028(00)00290-910.1016/S0039-6028(00)00290-9 ↗
18. 10.1021/jp012948110.1021/jp0129481 ↗
19. Long Y · J. Phys.: Condens. Matter · 2005 · 17 · 614910.1088/0953-8984/17/39/004 ↗
20. Kantorovich L Trevethan T Foster A · 2008
21. 10.1063/1.184146210.1063/1.1841462 ↗
22. 10.1016/S0039-6028(02)01637-010.1016/S0039-6028(02)01637-0 ↗
23. 10.1007/s00339-003-2437-510.1007/s00339-003-2437-5 ↗
24. Scheer M · Phys. Rev. · 1998 · 58 · 205162
25. 10.1103/PhysRevA.61.01250510.1103/PhysRevA.61.012505 ↗
26. 10.1016/S0167-5729(97)00005-810.1016/S0167-5729(97)00005-8 ↗
27. 10.1103/PhysRevLett.91.19610210.1103/PhysRevLett.91.196102 ↗
28. 10.1103/PhysRevLett.98.20610310.1103/PhysRevLett.98.206103 ↗
29. 10.1021/jp807340k10.1021/jp807340k ↗