Simple Low-Temperature GaN/Diamond Bonding Process with an Atomically Thin Intermediate Layer
Source abstract
Abstract
High Resolution Image Download MS PowerPoint Slide We demonstrated the low-temperature bonding of GaN and diamond substrates using wet chemical treatments. The GaN and diamond surfaces treated with HCl and NH 4 OH/H 2 O 2 solutions, respectively, could adhere to each other by contact under atmospheric conditions. After annealing at 200 °C, they were bonded with a shear strength of 8.19 MPa. Interfacial observations revealed that the GaN and diamond crystallines were bonded through an ∼3 nm-thick amorphous layer consisting of Ga, O, and sp 2 -C. The proposed bonding process consists of wet chemical treatment followed by low-temperature annealing under atmospheric conditions. As this simple process enables GaN/diamond integration without adhesive layers, it would contribute to future high-power and high-frequency GaN devices integrated on the diamond heat spreader.
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Research context
OpenAlex topics: GaN-based semiconductor devices and materials · Metal and Thin Film Mechanics · Semiconductor materials and devices
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Device Technology Research Institute, National Institute of Advanced Industrial Science and Technology, Tsukuba, Ibaraki 305-8564, Japan
Graduate School of Science and Technology, Tokyo University of Science, Noda, Chiba 278-8510, Japan
Funding
New Energy and Industrial Technology Development Organization
References (44)
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