Correction: Recent progress in controlled nano/micro cracking as an alternative nano-patterning method for functional applications
Source abstract
Abstract
Correction for ‘Recent progress in controlled nano/micro cracking as an alternative nano-patterning method for functional applications’ by Jinwook Jung et al. , Nanoscale Horiz. , 2020, DOI: 10.1039/D0NH00241K.
Only a short abstract or summary was supplied by the source.
Source: crossref · Quality: short
Research context
OpenAlex topics: Integrated Circuits and Semiconductor Failure Analysis · Nanofabrication and Lithography Techniques
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Applied Nano and Thermal Science Lab
Department of Mechanical Engineering
Seoul National University
Seoul
Republic of Korea
Hanyang University
Ansan
Novel Applied Nano Optics Lab
Department of Physics
Kyungpook National University
Daegu 41566
References
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