conference paper·2006-01-01

DEVELOPMENT OF NANOSCALE THERMAL CONDUCTIVITY IMAGING METHOD USING THERMOELECTRIC SCANNING THERMAL MICROSCOPE PROBE

Oh‐Sun Kwon, Heejae Roh, K. T. Kim, Joon Sik Lee, Soo Hyung Park, Young Ki Choi, Arun Majumdar

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OpenAlex topics: Thermography and Photoacoustic Techniques · Advanced MEMS and NEMS Technologies

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