Correction: Quantitative in situ TEM tensile fatigue testing on nanocrystalline metallic ultrathin films
Source abstract
Abstract
Correction for ‘Quantitative in situ TEM tensile fatigue testing on nanocrystalline metallic ultrathin films’ by Ehsan Hosseinian, et al., Nanoscale, 2013, 5, 12532–12541.
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Semiconductor materials and interfaces · Microstructure and mechanical properties · Aluminum Alloys Composites Properties
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