Nanoscale electrochemical 3D deposition of cobalt with nanosecond voltage pulses in an STM
Source abstract
Abstract
To explore a minimal feature size of <100 nm with electrochemical additive manufacturing, we use a strategy originally applied to microscale electrochemical machining for the nanoscale deposition of Co on Au. The concept's essence is the localization of electrochemical reactions below a probe during polarization with ns-long voltage pulses. As shown, a confinement that exceeds that predicted by a simple model based on the time constant for one-dimensional double layer charging enables a feature size of <100 nm for 2D patterning. We further indirectly verify the potential for out-of-plane deposition by tracking growth curves of high-aspect-ratio deposits. Importantly, we report a lack of anodic stability of Au tips used for patterning. As an inert probe is the prerequisite for controlled structuring, we experimentally verify an increased resistance of Pt probes against degradation. Consequently, the developed setup and processes show a path towards reproducible direct 2D and 3D patterning of metals at the nanoscale.
Source: openalex_inverted_index · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: Electrodeposition and Electroless Coatings · Anodic Oxide Films and Nanostructures · Semiconductor materials and interfaces
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Laboratory for Nanometallurgy, Department of Materials, Federal Institute of Technology (ETH) Zürich, 8093 Zürich, Switzerland
Institute of Physical Chemistry, Karlsruhe Institute of Technology, 76131 Karlsruhe, Germany
Funding
Eidgenössische Technische Hochschule Zürich
References (30)
Show source-provided references
1. Sattelkow · ACS Appl. Mater. Interfaces · 2019 · 11 · 2265510.1021/acsami.9b04497 ↗
2. Arnold · Adv. Funct. Mater. · 2018 · 28 · 170738710.1002/adfm.201707387 ↗
3. Kuhness · ACS Appl. Mater. Interfaces · 2021 · 13 · 117810.1021/acsami.0c17030 ↗
4. Reiser · Nat. Commun. · 2019 · 10 · 185310.1038/s41467-019-09827-1 ↗
5. Hirt · Adv. Mater. · 2017 · 201604211 · 160421110.1002/adma.201604211 ↗
6. Botman · Nanotechnology · 2009 · 20 · 37200110.1088/0957-4484/20/37/372001 ↗
7. Lukasczyk · Small · 2008 · 4 · 84110.1002/smll.200701095 ↗
8. Utke · J. Vac. Sci. Technol., B: Microelectron. Nanometer Struct.–Process., Meas., Phenom. · 2000 · 18 · 316810.1116/1.1319690 ↗
9. Reiser · Adv. Funct. Mater. · 2020 · 30 · 191049110.1002/adfm.201910491 ↗
10. Rohner · Nanoscale · 2020 · 12 · 2015810.1039/D0NR04593D ↗
11. Schneider · Adv. Funct. Mater. · 2016 · 26 · 83310.1002/adfm.201503705 ↗
12. Skylar-Scott · Proc. Natl. Acad. Sci. U. S. A. · 2016 · 113 · 613710.1073/pnas.1525131113 ↗
13. Hengsteler · Nano Lett. · 2021 · 21 · 909310.1021/acs.nanolett.1c02847 ↗
14. Hirt · Adv. Mater. · 2016 · 28 · 231110.1002/adma.201504967 ↗
15. Momotenko · ACS Nano · 2016 · 10 · 887110.1021/acsnano.6b04761 ↗
16. Schindler · J. Electrochem. Soc. · 2001 · 148 · C12410.1149/1.1343107 ↗
17. Schuster · Phys. Rev. Lett. · 1998 · 80 · 559910.1103/PhysRevLett.80.5599 ↗
18. Maynor · Langmuir · 2001 · 17 · 257510.1021/la001755m ↗
19. Obermair · Beilstein J. Nanotechnol. · 2012 · 3 · 82410.3762/bjnano.3.92 ↗
20. Jansson · J. Electrochem. Soc. · 2000 · 147 · 181010.1149/1.1393439 ↗
21. Li · Appl. Phys. Lett. · 1992 · 60 · 118110.1063/1.107398 ↗
22. LaGraff · J. Phys. Chem. · 1995 · 99 · 1000910.1021/j100024a050 ↗
23. Schuster · Science · 2000 · 289 · 9810.1126/science.289.5476.98 ↗
24. Ma · ChemPhysChem · 2010 · 11 · 61610.1002/cphc.200900713 ↗
25. Schuster · ChemPhysChem · 2007 · 8 · 3410.1002/cphc.200600401 ↗
26. de Abril · Nanotechnology · 2008 · 19 · 32530110.1088/0957-4484/19/32/325301 ↗
27. Kock · Electrochim. Acta · 2003 · 48 · 321310.1016/S0013-4686(03)00374-8 ↗
28. Bešter-Rogač · J. Chem. Eng. Data · 2008 · 53 · 135510.1021/je8001255 ↗
29. M.Aarts , A.Reiser , R.Spolenak and E.Alarcon-llado , ChemRxiv , 2021
30. Gramotnev · Nat. Photonics · 2010 · 4 · 8310.1038/nphoton.2009.282 ↗