Increased localization precision by interference fringe analysis
Source abstract
Abstract
We report a novel optical single-emitter-localization methodology that uses the phase induced by path length differences in a Mach-Zehnder interferometer to improve localization precision. Using information theory, we demonstrate that the localization capability of a modified Fourier domain signal generated by photon interference enables a more precise localization compared to a standard Gaussian intensity distribution of the corresponding point-spread function. The calculations were verified by numerical simulations and an exemplary experiment, where the centers of metal nanoparticles were localized to a precision of 3 nm.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Advanced Fluorescence Microscopy Techniques · Force Microscopy Techniques and Applications · Near-Field Optical Microscopy
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (33)
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