Edges in bilayered h-BN: insights into the atomic structure
Source abstract
Abstract
This study is devoted to the study of the edges of bilayered h-BN, whose atomic structure was previously generally unknown. It is shown that the edges tend to connect regardless of the edge cut. A defectless connection can be expected only in the case of a zigzag edge, while in other cases a series of tetragonal and octagonal defects will be formed. This result was obtained by carrying out an analogy between the edge of bilayered h-BN and the interface of monolayer h-BN. Information on the structure and energetics of closed edges allowed us to predict the shape of holes in h-BN, which agreed with the reference experimental data. Finally, it is shown that the closed edges do not create electronic states in the band gap, thus not changing the dielectricity of h-BN.
Source: openalex_inverted_index · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: Graphene research and applications · Boron and Carbon Nanomaterials Research · Thermal properties of materials
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Rzhanov Institute of Semiconductor Physics, Novosibirsk 630090, Russian Federation
National University of Science and Technology MISIS, Moscow 119049, Russian Federation
Funding
Russian Science Foundation · Ministry of science and higher education of the Russian Federation
References (53)
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