journal article·2015

Bonding and electronic states of boron in silicon nanowires characterized by an infrared synchrotron radiation beam

N. Fukata, W. Jevasuwan, Y. Ikemoto, T. Moriwaki

Nanoscale· Volume 7· Issue 16
Publisher page

Abstract

The infrared synchrotron radiation (IR-SR) beamline of SPring-8 as an IR light source was applied to characterize boron (B) atoms in silicon nanowires (SiNWs). The use of an IR-SR beam with much higher brilliance than conventional IR light sources and a wide range of wavenumbers from visible to far IR regions made it possible to detect a local vibrational mode of B in SiNWs. The use of this technique has also made it possible to detect other IR peaks related to transitions of a bound hole from the ground state of a B acceptor atom to excited states, clarifying the electronic state of B acceptors in SiNWs.
Source: openalex_inverted_index · Quality: candidate unverified · Source record ↗

Research context

OpenAlex topics: Nanowire Synthesis and Applications · Semiconductor materials and interfaces · Advancements in Semiconductor Devices and Circuit Design

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

International Center for Materials Nanoarchitectonics

National Institute for Materials Science

Tsukuba, Japan

Japan Synchrotron Radiation Research Institute

Sayo, Japan

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