Temperature dependence of vickers microhardness and creep of InBi single crystals
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OpenAlex topics: Semiconductor Quantum Structures and Devices · Semiconductor materials and interfaces · Integrated Circuits and Semiconductor Failure Analysis
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References (11)
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1. Atkins A G, Silverio A and Tabor D 1966J. Inst. Met. 94 369
2. Atkins A G 1973The science of hardness testing and its research applications (eds.) J H Westbrook and H Conrd (ASM, Ohio)
3. Bhatt V P and Desai C F 1978Indian J. Pure Appl. Phys. 16 960
4. Binnie W P 1956Acta Crystallogr. 9 68610.1107/S0365110X56001893 ↗
5. Hargreaves F 1928J. Inst. Met. 39 301
6. Holloman J and Lubhan J 1947 General Electric Review, Feb.–April
7. Ito K 1923Sci. Pap. Sendai Tohoku, Univ. Ser 112 137
8. Lytton J L, Shepard L A and Dorn J E 1958Trans, AIME 212 220
9. Setty D L R and Mungurwadi B D 1969Phys. Rev. 183 38710.1103/PhysRev.183.387 ↗
10. Shishokin V P 1930Z. Anorg. Chem. 189 26310.1002/zaac.19301890124 ↗
11. White J J, Davis J H and Walter H U 1975J. Appl. Phys. 46 1110.1063/1.321332 ↗