journal article·2020-08Open access

Open-hardware, High-vacuum Storage for TEM Holders Remedies and Quantifies Hydrocarbon Contamination

Yin Min Goh, Jonathan Schwartz, Tao Ma, Bobby Kerns, Robert Hovden

Microscopy and Microanalysis· Volume 26· Issue S2

Abstract

Yin Min Goh, Jonathan Schwartz, Tao Ma, Bobby Kerns, Robert Hovden; Open-hardware, High-vacuum Storage for TEM Holders Remedies and Quantifies Hydrocarbon
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Advanced X-ray Imaging Techniques · Advanced X-ray and CT Imaging · Nuclear Physics and Applications

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