NanoCartography: Mathematics of Crystal Orientation in Double Tilt Holders

Kevin Fiedler; Matthew Olszta

doi:10.1017/s1431927620013963

journal article·2020-08Open access

NanoCartography: Mathematics of Crystal Orientation in Double Tilt Holders

Kevin Fiedler, Matthew Olszta

Microscopy and Microanalysis· Volume 26· Issue S2

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Source abstract

Abstract

Kevin Fiedler, Matthew Olszta; NanoCartography: Mathematics of Crystal Orientation in Double Tilt Holders, Microscopy and Microanalysis, Volume 26, Issue S

Only a short abstract or summary was supplied by the source.

Source: openalex_inverted_index · Quality: short

Research context

Nanomaterials

OpenAlex topics: Surface and Thin Film Phenomena · Advanced Materials Characterization Techniques · Electron and X-Ray Spectroscopy Techniques

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References (6)

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3. ALPHABETA: a dedicated open-source tool for calculating TEM stage tilt angles

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5. 10.1016/0304-3991(95)00049-710.1016/0304-3991(95)00049-7 ↗

6. 10.1107/S002188989400206210.1107/S0021889894002062 ↗