Low-voltage STEM-EELS Quantification for Beam Sensitive Material Characterization
Source abstract
Abstract
Nicolas Dumaresq, Nicolas Brodusch, Raynald Gauvin; Low-voltage STEM-EELS Quantification for Beam Sensitive Material Characterization, Microscopy and Micro
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Ga2O3 and related materials
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References (4)
Show source-provided references
1. 10.1016/j.micron.2019.01.00510.1016/j.micron.2019.01.005 ↗
2. 10.1038/nchem.28210.1038/nchem.282 ↗
3. Williams · 2009 · 53
4. 10.1103/PhysRevB.82.11340410.1103/PhysRevB.82.113404 ↗