journal article·2020-08Open access

Plasma Enhanced Atomic Layer-etched and Regrown GaN-on-GaN High Power p-n Diodes

Prudhvi Ram Peri, Kevin Hatch, Daniel Messina, Kai Fu, Yuji Zhao, Robert Nemanich, David Smith

Microscopy and Microanalysis· Volume 26· Issue S2

Abstract

Prudhvi Ram Peri, Kevin Hatch, Daniel Messina, Kai Fu, Yuji Zhao, Robert Nemanich, David Smith; Plasma Enhanced Atomic Layer-etched and Regrown GaN-on-GaN
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: GaN-based semiconductor devices and materials · Semiconductor materials and devices · Ga2O3 and related materials

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References (6)

Show source-provided references
1. 10.1364/AOP.10.00024610.1364/AOP.10.000246 ↗
2. 10.1063/1.12126810.1063/1.121268 ↗
3. 3. Oka, T. , Ueno, Y. , Ina, T. , and Hasegawa, K. , (2014).
4. 6. This work was supported by ARPA-E award DE-AR0000868. The authors acknowledge the use of facilities within the John M. Cowley Center for High Resolution Electron Microscopy at Arizona State University.
5. 10.1063/1.186111310.1063/1.1861113 ↗
6. 10.1109/TED.2014.236086110.1109/TED.2014.2360861 ↗