journal article·2020-08Open access

The Ultimate Detection Limit: Building Electron Diffraction Patterns One Electron at a Time

Christian Kisielowski, Petra Specht, David Yancey, Steve Rozeveld, Joo Kang, Alyssa McKenna, David Barton

Microscopy and Microanalysis· Volume 26· Issue S2

Abstract

Christian Kisielowski, Petra Specht, David Yancey, Steve Rozeveld, Joo Kang, Alyssa McKenna, David Barton; The Ultimate Detection Limit: Building Electron
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Electronic and Structural Properties of Oxides

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (7)

Show source-provided references
1. [7] The work at the Molecular Foundry was supported by the DOE Office of Science, Office of Basic Energy Sciences, under contract DE-AC02-05-CH11231 and a CRADA.
2. 10.1016/j.ultramic.2018.04.00710.1016/j.ultramic.2018.04.007 ↗
3. 10.1021/acs.nanolett.9b0307410.1021/acs.nanolett.9b03074 ↗
4. [1] Jönsson, C 1961 Zeitschrift für Physik 161 454–474; P G Merli, G F Missiroli, G Pozzi 1976 American Journal of Physics 44 306-7; H. Lichte, https://gigamove.rz.rwth-aachen.de/d/id/JDfcpin7bJbyde; A Tonomura, J Endo, T Matsuda, T Kawasaki and H Ezawa 1989, American Journal of Physics 57 117-120
5. 10.1007/s00894-007-0218-310.1007/s00894-007-0218-3 ↗
6. 10.1002/adfm.20180781810.1002/adfm.201807818 ↗
7. 10.1016/j.ultramic.2011.01.00710.1016/j.ultramic.2011.01.007 ↗