journal article·2020-08Open access

Pulsed Electron Beams for Mitigating Damage in Next-generation Electronic Materials

Elisah VandenBussche, Catherine Clark, Russell Holmes, David Flannigan

Microscopy and Microanalysis· Volume 26· Issue S2

Abstract

Elisah VandenBussche, Catherine Clark, Russell Holmes, David Flannigan; Pulsed Electron Beams for Mitigating Damage in Next-generation Electronic Materials
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Semiconductor materials and interfaces · Pulsed Power Technology Applications · Silicon and Solar Cell Technologies

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (10)

Show source-provided references
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10. [10] This material is based on work supported by the U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences under Award No. DE-SC0018204. This material is based upon work supported by the National Science Foundation Graduate Research Fellowship Program under Grant No. DGE-1348264.