From Scanning Electron Nanodiffraction to 4D-STEM: How and Why Coherence Matters

Jian-Min Zuo; Renliang Yuan; Haw-Wen Hsiao

doi:10.1017/s1431927620016517

journal article·2020-08Open access

From Scanning Electron Nanodiffraction to 4D-STEM: How and Why Coherence Matters

Jian-Min Zuo, Renliang Yuan, Haw-Wen Hsiao

Microscopy and Microanalysis· Volume 26· Issue S2

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Source abstract

Abstract

Jian-Min Zuo, Renliang Yuan, Haw-Wen Hsiao; From Scanning Electron Nanodiffraction to 4D-STEM: How and Why Coherence Matters, Microscopy and Microanalysis,

Only a short abstract or summary was supplied by the source.

Source: openalex_inverted_index · Quality: short

Research context

Nanomaterials

OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Force Microscopy Techniques and Applications

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References (6)

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