Secondary Ion Mass Spectrometry (SIMS) and Atom Probe Tomography (APT): Powerful Synergetic Techniques for Materials Scientists

Hugues Francois-Saint-Cyr; Isabelle Martin; Paula Peres; Christelle Guillermier; Ty Prosa; Wilfried Blanc; David Larson

doi:10.1017/s1431927620014944

journal article·2020-08Open access

Secondary Ion Mass Spectrometry (SIMS) and Atom Probe Tomography (APT): Powerful Synergetic Techniques for Materials Scientists

Hugues Francois-Saint-Cyr, Isabelle Martin, Paula Peres, Christelle Guillermier, Ty Prosa, Wilfried Blanc, David Larson

Microscopy and Microanalysis· Volume 26· Issue S2

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Abstract

Hugues Francois-Saint-Cyr, Isabelle Martin, Paula Peres, Christelle Guillermier, Ty Prosa, Wilfried Blanc, David Larson; Secondary Ion Mass Spectrometry (SIMS)

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Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Advanced Materials Characterization Techniques · Ion-surface interactions and analysis · Diamond and Carbon-based Materials Research

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References (5)

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