Retaining Precision at Low-dose and High-speed STEM Imaging Conditions
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Abstract
Tiarnan Mullarkey, Clive Downing, Lewys Jones; Retaining Precision at Low-dose and High-speed STEM Imaging Conditions, Microscopy and Microanalysis, Volume
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Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Integrated Circuits and Semiconductor Failure Analysis
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References (5)
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1. 10.1016/j.micron.2004.02.00310.1016/j.micron.2004.02.003 ↗
2. 10.1016/j.ultramic.2014.11.02810.1016/j.ultramic.2014.11.028 ↗
3. 10.1016/j.ultramic.2013.10.01910.1016/j.ultramic.2013.10.019 ↗
4. 10.1017/S143192761800288X10.1017/S143192761800288X ↗
5. [5] Tiarnan Mullarkey acknowledges funding from the SFI CDT ACM and AMBER2, and Lewys Jones acknowledges funding from SFI and the Royal Society.