Understanding and Controlling E-beam Damage in Operando EC-STEM
Source abstract
Abstract
B Layla Mehdi, Weiqun Li, Juhan Lee, Daniel Nicholls, Nigel Browning, Andrew Stevens; Understanding and Controlling E-beam Damage in Operando EC-STEM, Micr
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Silicon and Solar Cell Technologies
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (5)
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1. 5. This work was supported by the U.K. Faraday Institution. A portion of the results were obtained using the Environmental Molecular Sciences Laboratory (EMSL), a national scientific user facility sponsored by the Department of Energy's Office of Biological and Environmental Research and located at PNNL. PNNL is a multi-program national laboratory operated by Battelle for the U.S. Department of Energy (DOE) under Contract DE-AC05-76RL01830.
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3. 10.1021/acs.nanolett.5b0017510.1021/acs.nanolett.5b00175 ↗
4. 10.1063/1.509659510.1063/1.5096595 ↗
5. 10.1038/srep3426710.1038/srep34267 ↗