Pulsed-Laser-Driven TEM for Studying Temporal Aspects of Beam Damage
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Abstract
David Flannigan, Elisah VandenBussche; Pulsed-Laser-Driven TEM for Studying Temporal Aspects of Beam Damage, Microscopy and Microanalysis, Volume 26, Issue
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Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Integrated Circuits and Semiconductor Failure Analysis · Ion-surface interactions and analysis · Advanced Electron Microscopy Techniques and Applications
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References (13)
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4. [13] This material is based upon work supported by the U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences under Award No. DE-SC0018204. This material is based upon work partially supported by the National Science Foundation Graduate Research Fellowship Program under Grant DGE-1348264. Acknowledgment is made to the Donors of the American Chemical Society Petroleum Research Fund for partial support of this research.
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