An Automated and Rapid Process for Determining Number of Atoms in Supported Ultra-Small Metal Clusters
Source abstract
Abstract
Abstract Since heterogeneous catalysis depends on surface chemistry, insights into the structure of supported catalytic materials is vital for understanding catalysis. We have developed a mass spectroscopic technique using very high angle annular dark field images in a scanning transmission electron microscope (STEM), that gives the number of atoms per cluster. We have also developed a robust interactive computer program to analyze these images rapidly. In this proceeding, we will present our method and results on analyzing ultra-small and dispersed Pt clusters on amorphous carbon, as well as our preliminary results of Pt on γ-A12 O3. The ultra-small Pt clusters on the amorphous carbon Cu grid were made by a proprietary technique. Imaging for the STEM-based mass-spectroscopic technique was performed on a Field Emission Gun (FEG) VG HB601 STEM operated at l00kV. The absolute measured intensity from the clusters were converted to scattering cross-sections, which can then be converted to number of atoms: More details of this method can be found in Singhal, Yang and Gibson.
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Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Machine Learning in Materials Science
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Affiliations
UOP, 50 East Algonquin Road , Des Plaines, IL 60017
Frederick Seitzr Materials Research Laboratory, University of Illinois at Urbana-Champaign , Urbana, IL 61801
References (2)
Show source-provided references
1. Singhal · Ultramicroscopy · 1997 · 67 · 191.10.1016/S0304-3991(96)00094-0 ↗
2. Treacy · J. of Microscopy · 1989 · 156 · 211.10.1111/j.1365-2818.1989.tb02920.x ↗