journal article·1999-08-01

An Automated and Rapid Process for Determining Number of Atoms in Supported Ultra-Small Metal Clusters

JC Yang, S Bradley, JM Gibson

Microscopy and Microanalysis· Volume 5· Issue S2
Publisher page

Abstract

Abstract Since heterogeneous catalysis depends on surface chemistry, insights into the structure of supported catalytic materials is vital for understanding catalysis. We have developed a mass spectroscopic technique using very high angle annular dark field images in a scanning transmission electron microscope (STEM), that gives the number of atoms per cluster. We have also developed a robust interactive computer program to analyze these images rapidly. In this proceeding, we will present our method and results on analyzing ultra-small and dispersed Pt clusters on amorphous carbon, as well as our preliminary results of Pt on γ-A12 O3. The ultra-small Pt clusters on the amorphous carbon Cu grid were made by a proprietary technique. Imaging for the STEM-based mass-spectroscopic technique was performed on a Field Emission Gun (FEG) VG HB601 STEM operated at l00kV. The absolute measured intensity from the clusters were converted to scattering cross-sections, which can then be converted to number of atoms: More details of this method can be found in Singhal, Yang and Gibson.
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Research context

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Machine Learning in Materials Science

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

UOP, 50 East Algonquin Road , Des Plaines, IL 60017

Frederick Seitzr Materials Research Laboratory, University of Illinois at Urbana-Champaign , Urbana, IL 61801

References (2)

Show source-provided references
1. Singhal · Ultramicroscopy · 1997 · 67 · 191.10.1016/S0304-3991(96)00094-0 ↗
2. Treacy · J. of Microscopy · 1989 · 156 · 211.10.1111/j.1365-2818.1989.tb02920.x ↗