journal article·2001-08-01

Observation of Magnetic Film Using Magnetic Force Microscope (MFM) in Ultra-High Vacuum (UHV)

K Suzuki, S Kitamura, C B Mooney

Microscopy and Microanalysis· Volume 7· Issue S2
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Abstract

Abstract In recent years, the magnetic force microscope (MFM) has been used not only for the evaluation of magnetic media but also for the measurement of magnetic characteristics of quantum dots as well as in various fields, because the MFM can visualize magnetic field on the sample surface with the high resolution. The MFM observation in ultra-high vacuum (UHV) requires to reduce the adsorption layer on the sample surface for high resolution observation. The slope detection mode using the variation of vibrating cantilever is basically unstable in UHV due to the increase in the Q factor of the cantilever. Accordingly it has been used for the MFM observation in air. On the other hand, the FM detection technique offers a very high sensitivity because of the high Q factor. This repot describes the MFM technique to take a magnetic image steadily in UHV. We observed the surface of a magnetic material with MFM technique in UHV, and compared the slope detection technique, the phase detection technique using phase variation of cantilever vibration, and the FM detection technique.
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Research context

OpenAlex topics: Force Microscopy Techniques and Applications · Advanced Surface Polishing Techniques · Near-Field Optical Microscopy

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

JEOL Ltd. , Tokyo, Japan

JEOL US A Inc. , MA, 01960

References (1)

Show source-provided references
1. Ailbrecht · J. Appl. Phys. · 1991 · 69 · 66810.1063/1.347347 ↗