journal article·1998-07-01

Dose-Rate Dependence of Radiation Damage in Polymers

RF Egerton, I Rauf

Microscopy and Microanalysis· Volume 4· Issue S2
Publisher page

Abstract

Abstract Three aspects of radiation damage are of concern to electron microscopists: changes in crystallographic or molecular structure, mass loss and change in chemical composition. Structural change can be monitored from the fading of diffraction patterns or from loss of fine structure in an energy-loss spectrum. Total mass loss, in the form of a reduction in inelastic-scattering power, can be observed from the low-loss spectrum. Mass loss can also be monitored from energy-loss ionization edges, with the advantage that the loss of particular elements can be studied separately. It is possible to assign a characteristic dose De for the disappearance of a particular element. At room temperature, the amount of damage usually depends on the accumulated dose (exposure) but not on the dose rate (current density). However, cooling the specimen tends to reduce mass loss, probably because of the reduced diffusion coefficients.
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Research context

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Machine Learning in Materials Science · X-ray Spectroscopy and Fluorescence Analysis

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Affiliations

Physics Department, University of Alberta, Edmonton , Canada, T6G 2J1

References (3)

Show source-provided references
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