A Universal Method of In Situ FIB Lift-Out for Cryogenic Samples
Source abstract
Abstract
J Lindsay, C Parmenter, J Goulden; A Universal Method of In Situ FIB Lift-Out for Cryogenic Samples, Microscopy and Microanalysis, Volume 24, Issue S1, 1 A
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Ion-surface interactions and analysis
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References (4)
Show source-provided references
1. 10.1073/pnas.120133310910.1073/pnas.1201333109 ↗
2. Journal of Visualized Experiments · 2014 · 89
3. 10.1111/j.1365-2818.1991.tb03155.x10.1111/j.1365-2818.1991.tb03155.x ↗
4. 10.1111/j.1365-2818.2006.01567.x10.1111/j.1365-2818.2006.01567.x ↗