Scorpion: Facilitating High Throughput Electron Microscopy
Source abstract
Abstract
Venkata P Dandey, Peter Kahn, Hui Wei, Bridget Carragher, Clinton S Potter; Scorpion: Facilitating High Throughput Electron Microscopy, Microscopy and Micr
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Integrated Circuits and Semiconductor Failure Analysis
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (5)
Show source-provided references
1. 10.1016/j.jsb.2018.01.00210.1016/j.jsb.2018.01.002 ↗
2. 10.1016/j.jsb.2016.06.00110.1016/j.jsb.2016.06.001 ↗
3. 10.1016/j.jsb.2018.01.00110.1016/j.jsb.2018.01.001 ↗
4. 10.1021/acscentsci.8b0076010.1021/acscentsci.8b00760 ↗
5. (GM103310, OD019994-01) and the Agouron Institute (F00316).