Information theory based crystallographic symmetry classifications of a noisy 2D periodic scanning tunneling microscope image
Source abstract
Abstract
Peter Moeck, Andrew Dempsey, Connor Shu; Information theory based crystallographic symmetry classifications of a noisy 2D periodic scanning tunneling micro
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: X-ray Diffraction in Crystallography · Advanced Electron Microscopy Techniques and Applications · Force Microscopy Techniques and Applications
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References (10)
Show source-provided references
1. 10.1186/s40679-018-0051-z10.1186/s40679-018-0051-z ↗
2. P. Moeck , In: Microscopy Book Series No. 7, pp. 503–514, 2017, http://www.microscopy7.org/book/ 503–514.pdf.
3. 10.1023/A:100794892713910.1023/A:1007948927139 ↗
4. P. Moeck , arXiv:1902.04155, April 2019 (23 pages).
5. 10.3390/sym1005013310.3390/sym10050133 ↗
6. R. K. Vasudevan , private communication, the STM image is freely available as support material of [6].
7. P. Moeck and A. Dempsey , this conference proceedings.
8. P. Moeck , Proc. 11th IEEE Intern. Conf. on Nanotechnology, Portland, August 15-18, 2011, pp. 520–525.
9. 10.1186/s40679-015-0014-610.1186/s40679-015-0014-6 ↗
10. Vasudevan · npj Computational Materials · 2018 · 30 · 1