Advancements of Evactron^® Plasma Cleaning of Moxtek^® X-ray Windows

Journal Article Advancements of Evactron® Plasma Cleaning of Moxtek® X-ray Windows Get access Ewa Kosmowska, Ewa Kosmowska XEI Scientific, Inc., Redwood City, CA, USA Corresponding author: ewa@evactron.com Search for other works by this author on: Oxford Academic Google Scholar Michael Almond, Michael Almond Moxtek Inc., Orem, UT, USA Search for other works by this author on: Oxford Academic Google Scholar Josh Wong, Josh Wong Moxtek Inc., Orem, UT, USA Search for other works by this author on: Oxford Academic Google Scholar Brian Law, Brian Law Moxtek Inc., Orem, UT, USA Search for other works by this author on: Oxford Academic Google Scholar Barbara Armbruster, Barbara Armbruster XEI Scientific, Inc., Redwood City, CA, USA Search for other works by this author on: Oxford Academic Google Scholar Ronald Vane Ronald Vane XEI Scientific, Inc., Redwood City, CA, USA Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 25, Issue S2, 1 August 2019, Pages 556–557, https://doi.org/10.1017/S1431927619003519 Published: 01 August 2019