Analytical Electron Microscopy: Rivaling / Complementing Atom Probe Tomography
Source abstract
Abstract
MG Burke, Joven J H Lim; Analytical Electron Microscopy: Rivaling / Complementing Atom Probe Tomography, Microscopy and Microanalysis, Volume 25, Issue S2,
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Materials Characterization Techniques · Hydrogen embrittlement and corrosion behaviors in metals · Diamond and Carbon-based Materials Research
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (8)
Show source-provided references
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2. Cerezo · J. Phys · 1988 · 49 · 2510.1051/jphys:0198800490102500 ↗
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6. 10.1017/S143192760404056510.1017/S1431927604040565 ↗
7. 10.1063/1.114438210.1063/1.1144382 ↗
8. The authors acknowledge the support from EPSRC Grant No. EP/N017854/1 and EP/N017854/1.